DOI: 10.3724/SP.J.1089.2010.11131

Journal of Computer-Aided Design & Computer Graphics (计算机辅助设计与图形学学报) 2010/22:9 PP.1428-1434

Flip-Flop Selection for Partial Enhanced-Scan Delay Testing with High Transition Fault Coverage

A key issue brought by partial enhanced-scan delay testing is how to select the critical normal-scan flip-flops to be replaced with enhanced-scan cells. We present a flip-flop selection method based on the defined relative measure between a normal-scan cell and the undetected transition delay faults, by which a small number of selected normal-scan cells can be replaced with enhanced-scan cells to improve the probability of detecting transition delay faults effectively. Experimental results demonstrated that the proposed method can improve transition delay fault coverage with acceptable hardware overhead.

Key words:delay testing,transition delay fault,enhanced scan,fault coverage,flip-flop selection

ReleaseDate:2014-07-21 15:25:54

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