DOI: 10.3724/SP.J.1089.2010.11131
Journal of Computer-Aided Design & Computer Graphics (计算机辅助设计与图形学学报) 2010/22:9 PP.1428-1434
Li Huawei
1,2
Li Xiaowei
1,2
Abstract：
A key issue brought by partial enhanced-scan delay testing is how to select the critical normal-scan flip-flops to be replaced with enhanced-scan cells. We present a flip-flop selection method based on the defined relative measure between a normal-scan cell and the undetected transition delay faults, by which a small number of selected normal-scan cells can be replaced with enhanced-scan cells to improve the probability of detecting transition delay faults effectively. Experimental results demonstrated that the proposed method can improve transition delay fault coverage with acceptable hardware overhead.
ReleaseDate：2014-07-21 15:25:54
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