doi:

DOI: 10.3724/SP.J.1249.2019.02176

Journal of Shenzhen University Science and Engineering (深圳大学学报理工版) 2019/36:2 PP.176-181

A signal generator for ultra-high speed terahertz testing


Abstract:
The very high data rate of terahertz communication systems poses great challenges to the testing environment. This paper presents a pseudo-random bit sequence (PRBS) generator with the data rate up to 40 Gbit/s in the quadrature phase shift keying (QPSK) mode. The proposed PRBS generator, achieves bit rate up to 40 Gbit/s in the QPSK modulation mode which can adequately support the communication applications in terahertz frequency band. The PRBS generator utilizes the interleaved topology with high-speed multiplexers. The current mode logic (CML) gates are employed as the latch unit for high data rate operation. The circuit is implemented in standard 40 nm bulk complementary metal-oxide-semiconductor (CMOS) process and the layout area is 0.25×0.15 mm2. The power consumption of the PRBS generator is 37.5 mW at a supply voltage of 1.0 V. This technology can solve the bottleneck problem of terahertz high rate data testing.

Key words:terahertz,current mode logic (CML),pseudo-random bit sequence generator,quadrature phase shift keying (QPSK),complementary metal oxide semiconductor (CMOS),flip-flops,high-speed current mode logic

ReleaseDate:2019-12-02 09:24:38



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